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Month: July 2018

Shielding Performance Monitor Counters: a double edge weapon for safety and security

Posted on July 20, 2018July 20, 2018 by Stefano Di Carlo

Dr. Alessandro Vallero from TestGroup presented our latest study on “Multi-faceted Microarchitecture Level Reliability Characterization for NVIDIA and AMD GPUs” @ 2018 IEEE VLSI Test Symposium, San Francisco, CA, USA (April 22-25, 2018).

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Testgroup @ IOLTS 2018

Posted on July 2, 2018July 2, 2018 by Stefano Di Carlo

TestGroup team is attending IOLTS 2018 in Platja D’Aro (Spain). Interesting technical discussions and presentations, lot of friends and colleagues, all organized in a beautiful landscape …

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    Recent Posts

    • Hiring 15 PhD students in Europe in the field of Approximate Computing
    • Testgroup @ HiPEAC CSW 2019
    • Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications @ Microelectronics Reliability Journal
    • Paper accepted @ DFTS 2019
    • Invited talk @ 25th IEEE International Symposium on On-Line Testing and Robust System Design

    Recent comments

      News and blog posts

      • Hiring 15 PhD students in Europe in the field of Approximate Computing

        Hiring 15 PhD students in Europe in the field of Approximate Computing

        January 26, 2021
      • Testgroup @ HiPEAC CSW 2019

        Testgroup @ HiPEAC CSW 2019

        October 30, 2019
      • Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications @ Microelectronics Reliability Journal

        Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications @ Microelectronics Reliability Journal

        September 25, 2019
      • Paper accepted @ DFTS 2019

        Paper accepted @ DFTS 2019

        September 11, 2019
      • Invited talk @ 25th IEEE International Symposium on On-Line Testing and Robust System Design

        Invited talk @ 25th IEEE International Symposium on On-Line Testing and Robust System Design

        July 1, 2019
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