Dr. Alessandro Vallero from TestGroup presented our latest study on “Multi-faceted Microarchitecture Level Reliability Characterization for NVIDIA and AMD GPUs” @ 2018 IEEE VLSI Test Symposium, San Francisco, CA, USA (April 22-25, 2018).

TestGroup team is attending IOLTS 2018 in Platja D’Aro (Spain). Interesting technical discussions and presentations, lot of friends and colleagues, all organized in a beautiful landscape …