We are happy to announce that HiPEACinfo vol. 50 is now available for download from the HiPEAC website (https://www.hipeac.net/assets/public/publications/newsletter/hipeacinfo50.pdf). It contains an nice overview of the Clereco results. If you have a LinkedIn account, please consider posting about your article and sharing the link to the magazine via LinkedIn.
New paper titled “SIFI a reliability evaluation framework for soft-errors built on top of Multi2Sim” accepted for publication at the 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS’17), July 3-5, 2017 in Thessaloniki, Greece.
New paper titled “RT Level vs. Microarchitecture Level Reliability Assessment: Case Study on ARM Cortex-A9 CPU” accepted for publication at the 47th IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2017), June 26-29, 2017 in Denver, CO (USA).