Today at 5:15PM I’m going to give an invited talk at the 25th IEEE International Symposium on On-Line Testing and Robust System Design in Kazan in Rhodes (Greece).

The topic of the talk will be “Bayesian Models For Early Cross-Layer Reliability Analysis and Design Space Exploration” and will be part of Session 5S “Cost-Effective Resilience: Advanced Cross-Layer Analysis and Optimization Techniques” organized by Prof. M. Shafique (TU Wien).