Rhodes Island, Greece (July 1st, 2019).
Today at 5:15PM I’m going to give an invited talk at the 25th IEEE International Symposium on On-Line Testing and Robust System Design in Rhodes (Greece).
The topic of the talk will be “Bayesian Models For Early Cross-Layer Reliability Analysis and Design Space Exploration” and will be part of Session 5S “Cost-Effective Resilience: Advanced Cross-Layer Analysis and Optimization Techniques” organized by Prof. M. Shafique (TU Wien).
You can find the slides of the presentation on SlideShare.
Technical details related to the content of this presentation are available in the following related papers:
- A. Vallero, A. Savino, A. Carelli, S. Di Carlo “Bayesian models for early cross-layer reliability analysis and design space exploration”, 25th IEEE International Symposium on On-Line Testing and Robust System Design (Rodhes Island, Greece July 1-3, 2019)
- A. Savino, A. Vallero, S. Di Carlo, “ReDO: Cross-Layer Multi-Objective Design-Exploration Framework for Efficient Soft Error Resilient Systems” IEEE TRANSACTIONS ON COMPUTERS, Vol.undefined, ISSN: 0018-9340, DOI: 10.1109/TC.2018.2818735
- A. Vallero, A. Savino, A. Chatzidimitriou, M. Kaliorakis, M. Kooli, M. Riera Villanueva, G. Di Natale, A. Bosio, R. Canal, D. Gizopoulos, S. Di Carlo SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems IEEE TRANSACTIONS ON COMPUTERS, Vol.68, pp.765-783, ISSN: 0018-9340, DOI: 10.1109/TC.2018.288722
If you attend the conference please join the session.
Stefano Di CARLO