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Month: May 2017

Congratulations to Alessandro for completing his Ph.D.

Posted on May 31, 2017May 31, 2017 by Stefano Di Carlo

I’m very proud to announce that yesterday my student Alessandro Vallero defended his Ph.D. thesis in front of a committee of five experts in his research field and was awarded the Ph.D. degree in Computer Engineering “cum laude”,

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Alessandro Vallero Ph.D. defense

Posted on May 18, 2017 by Stefano Di Carlo

On May 30 Alessandro VALLERO will discuss his PhD thesis, titled ” Cross layer reliability estimation for digital systems”

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Testgroup @ IEEE European Test Symposium

Posted on May 18, 2017May 18, 2017 by Stefano Di Carlo

The 22nd IEEE European Test Symposium will start in a few days in Limassol (Cyprus).

Testgroup will be there with two interesting presentations.

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SIFI

Posted on May 16, 2017July 4, 2017 by Stefano Di Carlo

STT-MRAM model for CACTI simulator

Posted in Tools and downloads Leave a comment

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  • Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications @ Microelectronics Reliability Journal
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  • Invited talk @ 25th IEEE International Symposium on On-Line Testing and Robust System Design

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    Recent Posts

    • Hiring 15 PhD students in Europe in the field of Approximate Computing
    • Testgroup @ HiPEAC CSW 2019
    • Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications @ Microelectronics Reliability Journal
    • Paper accepted @ DFTS 2019
    • Invited talk @ 25th IEEE International Symposium on On-Line Testing and Robust System Design

    Recent comments

      News and blog posts

      • Hiring 15 PhD students in Europe in the field of Approximate Computing

        Hiring 15 PhD students in Europe in the field of Approximate Computing

        January 26, 2021
      • Testgroup @ HiPEAC CSW 2019

        Testgroup @ HiPEAC CSW 2019

        October 30, 2019
      • Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications @ Microelectronics Reliability Journal

        Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications @ Microelectronics Reliability Journal

        September 25, 2019
      • Paper accepted @ DFTS 2019

        Paper accepted @ DFTS 2019

        September 11, 2019
      • Invited talk @ 25th IEEE International Symposium on On-Line Testing and Robust System Design

        Invited talk @ 25th IEEE International Symposium on On-Line Testing and Robust System Design

        July 1, 2019
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