Some nice pictures of the hot topic session organized by Prof. Alberto Bosio (LIRMM – France) and Prof. Stefano Di Carlo (Politecnico di Torino) at the 36th IEEE VLSI Test Symposium (VTS 2018) Hayatt Centric Fisherman’s Wharf San Francisco, California USA.
Three interesting presentations introduced the audience into challenging in the world of the approximate computing:
- Formal verification techniques for search-based functional approximation of digital circuits
Presenter: Lukas Sekanina and Zdenek Vasicek, FIT
- Testing Approximate Digital Circuits
Presenter: Alberto Bosio and Marcello Traiola, LIRMM
- Benefits and Challenges of Approximate Computing in Applications Reliability
Presenter: Paolo Rech, Daniel Oliveria and Fernando Fernandes, UFRGS