Dr. Alessandro Vallero from TestGroup presented our latest study on “Multi-faceted Microarchitecture Level Reliability Characterization for NVIDIA and AMD GPUs” @ 2018 IEEE VLSI Test Symposium, San Francisco, CA, USA (April 22-25, 2018).
The paper will be soon available on IEEE Explore:
A. Vallero , S. Tselonis, D. Gizopoulos and S. Di Carlo, “Multi-faceted Microarchitecture Level Reliability Characterization for NVIDIA and AMD GPUs”, IEEE VLSI Test Symposium 2018 (VTS 2018), San Francisco, CA (USA), April 22-25, 2018.
Enjoy watching the presentation on our YouTube channel.
You can find the slides of the presentation on SlideShare.